Não é permitido excluir uma pasta vazia criptografada por encfs

6

Eu tenho uma pasta criptografada por encfs e apenas recorto o conteúdo de uma subpasta dele e a colei em outra pasta fora da criptografada pelo encfs. Ao fazer isso, recebi uma mensagem de erro dizendo que uma subpasta não pôde ser excluída porque não está vazia.

O problema é que todos os arquivos foram colados na nova pasta e nenhum arquivo foi deixado no antigo, que eu verifiquei com ls -ll -a na subpasta:

total 8
drwxrwx--- 1 root plugdev 4096 Nov  9 16:19 .
drwxrwx--- 1 root plugdev 4096 Nov  9 16:19 ..

Eu não sei quais informações total 8 devem me dar aqui. Se eu tentar sudo ls -ll -a , não tenho permissão para fazer isso.

Basicamente, o mesmo vale para rm . Se eu fizer rm -rf foldername , ele diz que a pasta não está vazia. Se eu fizer sudo rm -rf foldername , ele diz que não tenho permissão para fazer isso.

ATUALIZAÇÃO (19 de novembro):

A saída de sudo smartctl --all /dev/sda é

smartctl 6.4 2014-10-07 r4002 [x86_64-linux-4.2.0-040200-generic] (local build)
Copyright (C) 2002-14, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model:     LITEONIT LMT-256M6M mSATA 256GB
Serial Number:    TW0XXM30550853571923
Firmware Version: DM8110C
User Capacity:    256.060.514.304 bytes [256 GB]
Sector Size:      512 bytes logical/physical
Rotation Rate:    Solid State Device
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   ATA8-ACS, ATA/ATAPI-7 T13/1532D revision 4a
SATA Version is:  SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:    Thu Nov 19 10:20:30 2015 CET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                    was never started.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0) The previous self-test routine completed
                    without error or no self-test has ever 
                    been run.
Total time to complete Offline 
data collection:        (   10) seconds.
Offline data collection
capabilities:            (0x15) SMART execute Offline immediate.
                    No Auto Offline data collection support.
                    Abort Offline collection upon new
                    command.
                    No Offline surface scan supported.
                    Self-test supported.
                    No Conveyance Self-test supported.
                    No Selective Self-test supported.
SMART capabilities:            (0x0002) Does not save SMART data before
                    entering power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x00) Error logging supported.
                    General Purpose Logging supported.
Short self-test routine 
recommended polling time:    (   1) minutes.
Extended self-test routine
recommended polling time:    (  10) minutes.
SCT capabilities:          (0x003d) SCT Status supported.
                    SCT Error Recovery Control supported.
                    SCT Feature Control supported.
                    SCT Data Table supported.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  5 Reallocated_Sector_Ct   0x0003   100   100   000    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0003   100   100   000    Pre-fail  Always       -       3655
175 Program_Fail_Count_Chip 0x0003   100   100   000    Pre-fail  Always       -       0
176 Erase_Fail_Count_Chip   0x0003   100   100   000    Pre-fail  Always       -       0
177 Wear_Leveling_Count     0x0003   100   100   000    Pre-fail  Always       -       222113
178 Used_Rsvd_Blk_Cnt_Chip  0x0003   100   100   000    Pre-fail  Always       -       0
179 Used_Rsvd_Blk_Cnt_Tot   0x0003   100   100   000    Pre-fail  Always       -       0
180 Unused_Rsvd_Blk_Cnt_Tot 0x0003   100   100   005    Pre-fail  Always       -       1664
181 Program_Fail_Cnt_Total  0x0003   100   100   000    Pre-fail  Always       -       0
182 Erase_Fail_Count_Total  0x0003   100   100   000    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0003   100   100   000    Pre-fail  Always       -       0
195 Hardware_ECC_Recovered  0x0003   100   100   000    Pre-fail  Always       -       0
241 Total_LBAs_Written      0x0003   100   100   000    Pre-fail  Always       -       286617
242 Total_LBAs_Read         0x0003   100   100   000    Pre-fail  Always       -       414678

SMART Error Log Version: 0
No Errors Logged

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%     44292         -
# 2  Short offline       Completed without error       00%     56577         -
# 3  Short offline       Completed without error       00%     56321         -
# 4  Short offline       Completed without error       00%     56321         -
# 5  Short offline       Completed without error       00%      1024         -
# 6  Short offline       Completed without error       00%      1024         -
# 7  Short offline       Completed without error       00%       256         -
# 8  Extended offline    Completed without error       00%         0         -

Selective Self-tests/Logging not supported
    
por Yanick Nedderhoff 09.11.2015 / 16:53

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