erro de E / S, dev sda, setor xxxxxxxxxx

6

Cabeçalho

Minha máquina caiu algumas vezes esta semana. Executei o teste smartmontools e obtive este resultado:

=== START OF INFORMATION SECTION ===
Model Family:     Fujitsu MJA BH
Device Model:     FUJITSU MJA2250BH G2
Serial Number:    K94PT972B7RS
LU WWN Device Id: 5 00000e 043bcbddd
Firmware Version: 8919
User Capacity:    250,059,350,016 bytes [250 GB]
Sector Size:      512 bytes logical/physical
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 3f
Local Time is:    Mon Feb 10 09:24:22 2014 IST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                    was never started.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      ( 118) The previous self-test completed having
                    the read element of the test failed.
Total time to complete Offline 
data collection:        (  783) seconds.
Offline data collection
capabilities:            (0x51) SMART execute Offline immediate.
                    No Auto Offline data collection support.
                    Suspend Offline collection upon new
                    command.
                    No Offline surface scan supported.
                    Self-test supported.
                    No Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                    General Purpose Logging supported.
Short self-test routine 
recommended polling time:    (   2) minutes.
Extended self-test routine
recommended polling time:    ( 111) minutes.
SCT capabilities:          (0x003f) SCT Status supported.
                    SCT Error Recovery Control supported.
                    SCT Feature Control supported.
                    SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   100   078   046    Pre-fail  Always       -       41112
  2 Throughput_Performance  0x0025   253   253   030    Pre-fail  Offline      -       33619968
  3 Spin_Up_Time            0x0023   100   100   025    Pre-fail  Always       -       0
  4 Start_Stop_Count        0x0032   099   099   000    Old_age   Always       -       4448
  5 Reallocated_Sector_Ct   0x0033   253   253   024    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002f   100   100   047    Pre-fail  Always       -       2140
  8 Seek_Time_Performance   0x0025   253   253   019    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   089   089   000    Old_age   Always       -       5655
 10 Spin_Retry_Count        0x0033   253   253   020    Pre-fail  Always       -       0
 11 Calibration_Retry_Count 0x0032   253   253   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       4319
180 Unused_Rsvd_Blk_Cnt_Tot 0x002f   100   100   098    Pre-fail  Always       -       0
182 Erase_Fail_Count_Total  0x0032   100   100   000    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0032   253   100   000    Old_age   Always       -       327680
184 End-to-End_Error        0x0033   253   253   097    Pre-fail  Always       -       0
185 Unknown_Attribute       0x0030   100   100   000    Old_age   Offline      -       2
186 Unknown_Attribute       0x0032   253   253   000    Old_age   Always       -       1441792
187 Reported_Uncorrect      0x0032   100   026   000    Old_age   Always       -       281470684365183
188 Command_Timeout         0x0032   100   099   000    Old_age   Always       -       1
189 High_Fly_Writes         0x003a   253   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   067   050   045    Old_age   Always       -       33 (Min/Max 23/33)
191 G-Sense_Error_Rate      0x0032   253   098   000    Old_age   Always       -       16580617
192 Power-Off_Retract_Count 0x0032   096   096   000    Old_age   Always       -       71566404
193 Load_Cycle_Count        0x0032   099   099   000    Old_age   Always       -       35363
195 Hardware_ECC_Recovered  0x003a   253   253   000    Old_age   Always       -       20430
196 Reallocated_Event_Count 0x0032   253   253   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   100   087   000    Old_age   Always       -       1
198 Offline_Uncorrectable   0x0030   253   253   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   253   253   000    Old_age   Always       -       0

SMART Error Log Version: 1
ATA Error Count: 517 (device log contains only the most recent five errors)
    CR = Command Register [HEX]
    FR = Features Register [HEX]
    SC = Sector Count Register [HEX]
    SN = Sector Number Register [HEX]
    CL = Cylinder Low Register [HEX]
    CH = Cylinder High Register [HEX]
    DH = Device/Head Register [HEX]
    DC = Device Command Register [HEX]
    ER = Error register [HEX]
    ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 517 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 00 00 00 a0

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ec 00 00 00 00 00 a0 08      00:03:39.320  IDENTIFY DEVICE
  c8 00 80 80 28 97 ec 08      00:03:30.939  READ DMA
  c8 00 80 20 2a 97 ec 08      00:03:27.409  READ DMA
  c8 00 90 c0 5b e2 e5 08      00:03:27.394  READ DMA
  ca 00 98 00 9b 98 ec 08      00:03:27.393  WRITE DMA

Error 516 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 00 00 00 a0

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ec 00 00 00 00 00 a0 08      00:03:23.216  IDENTIFY DEVICE
  c8 00 40 40 28 97 ec 08      00:03:14.822  READ DMA
  ef 10 02 00 00 00 a0 08      00:03:14.821  SET FEATURES [Reserved for Serial ATA]
  ec 00 00 00 00 00 a0 08      00:03:14.819  IDENTIFY DEVICE
  ef 03 45 00 00 00 a0 08      00:03:14.819  SET FEATURES [Set transfer mode]

Error 515 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 00 00 00 a0

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ec 00 00 00 00 00 a0 08      00:03:14.815  IDENTIFY DEVICE
  c8 00 40 40 28 97 ec 08      00:03:06.445  READ DMA
  c8 00 08 18 2a 97 ec 08      00:03:04.772  READ DMA
  ef 10 02 00 00 00 a0 08      00:03:04.772  SET FEATURES [Reserved for Serial ATA]
  ec 00 00 00 00 00 a0 08      00:03:04.770  IDENTIFY DEVICE

Error 514 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 03 1d 2a 97 ec  Error: UNC 3 sectors at LBA = 0x0c972a1d = 211233309

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 18 2a 97 ec 08      00:03:00.416  READ DMA
  ef 10 02 00 00 00 a0 08      00:03:00.415  SET FEATURES [Reserved for Serial ATA]
  ec 00 00 00 00 00 a0 08      00:03:00.413  IDENTIFY DEVICE
  ef 03 45 00 00 00 a0 08      00:03:00.413  SET FEATURES [Set transfer mode]
  ef 10 02 00 00 00 a0 08      00:03:00.413  SET FEATURES [Reserved for Serial ATA]

Error 513 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 03 1d 2a 97 ec  Error: UNC 3 sectors at LBA = 0x0c972a1d = 211233309

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  c8 00 08 18 2a 97 ec 08      00:02:56.010  READ DMA
  ea 00 00 00 00 00 a0 08      00:02:55.973  FLUSH CACHE EXT
  35 00 08 20 44 d6 e0 08      00:02:55.973  WRITE DMA EXT
  ea 00 00 00 00 00 a0 08      00:02:55.949  FLUSH CACHE EXT
  35 00 38 e8 43 d6 e0 08      00:02:55.949  WRITE DMA EXT

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed: read failure       60%      5618         201724230
# 2  Short offline       Completed without error       00%      5617         -
# 3  Short offline       Completed without error       00%      5617         -
# 4  Extended offline    Completed without error       00%      5600         -
# 5  Short offline       Completed: read failure       90%      5595         239457889
# 6  Short offline       Completed: read failure       90%      5595         239457889
# 7  Short captive       Completed without error       00%      5305         -
# 8  Short captive       Completed without error       00%      5301         -
# 9  Short captive       Completed without error       00%      5301         -
#10  Short captive       Completed without error       00%      5301         -
#11  Short captive       Completed: read failure       90%      5301         214242167
#12  Extended offline    Completed: read failure       60%      4819         176075039
#13  Short offline       Completed without error       00%      4819         -
#14  Short offline       Aborted by host               90%       214         -
#15  Short offline       Aborted by host               90%       214         -
#16  Short offline       Completed without error       00%       214         -
#17  Short offline       Completed without error       00%       214         -
#18  Short offline       Completed without error       00%         4         -
#19  Short offline       Completed without error       00%         3         -
#20  Short offline       Completed without error       00%         2         -
#21  Short offline       Completed without error       00%         1         -
4 of 5 failed self-tests are outdated by newer successful extended offline self-test # 4

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Alguém por favor pode me dizer o que isso significa? Devo substituir meu disco rígido imediatamente?

Atualização: Como o landroni sugeriu, fiz um curto e estendido auto-teste usando o gsmartcontrol. O auto-teste curto foi executado sem gerar erros. Teste estendido foi abortado em 40% por causa de erros. Aqui está a pasta dos registros de autoteste:

smartctl 5.41 2011-06-09 r3365 [x86_64-linux-3.2.0-51-generic] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     Fujitsu MJA BH
Device Model:     FUJITSU MJA2250BH G2
Serial Number:    K94PT972B7RS
LU WWN Device Id: 5 00000e 043bcbddd
Firmware Version: 8919
User Capacity:    250,059,350,016 bytes [250 GB]
Sector Size:      512 bytes logical/physical
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 3f
Local Time is:    Sun Feb 23 21:13:50 2014 IST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00) Offline data collection activity
                    was never started.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      ( 118) The previous self-test completed having
                    the read element of the test failed.
Total time to complete Offline 
data collection:        (  783) seconds.
Offline data collection
capabilities:            (0x51) SMART execute Offline immediate.
                    No Auto Offline data collection support.
                    Suspend Offline collection upon new
                    command.
                    No Offline surface scan supported.
                    Self-test supported.
                    No Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003) Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01) Error logging supported.
                    General Purpose Logging supported.
Short self-test routine 
recommended polling time:    (   2) minutes.
Extended self-test routine
recommended polling time:    ( 111) minutes.
SCT capabilities:          (0x003f) SCT Status supported.
                    SCT Error Recovery Control supported.
                    SCT Feature Control supported.
                    SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   100   078   046    Pre-fail  Always       -       124861
  2 Throughput_Performance  0x0025   253   253   030    Pre-fail  Offline      -       33619968
  3 Spin_Up_Time            0x0023   100   100   025    Pre-fail  Always       -       0
  4 Start_Stop_Count        0x0032   099   099   000    Old_age   Always       -       4489
  5 Reallocated_Sector_Ct   0x0033   253   253   024    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002f   100   100   047    Pre-fail  Always       -       1157
  8 Seek_Time_Performance   0x0025   253   253   019    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   089   089   000    Old_age   Always       -       5693
 10 Spin_Retry_Count        0x0033   253   253   020    Pre-fail  Always       -       0
 11 Calibration_Retry_Count 0x0032   253   253   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       4342
180 Unused_Rsvd_Blk_Cnt_Tot 0x002f   100   100   098    Pre-fail  Always       -       0
182 Erase_Fail_Count_Total  0x0032   100   100   000    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0032   253   100   000    Old_age   Always       -       327680
184 End-to-End_Error        0x0033   253   253   097    Pre-fail  Always       -       0
185 Unknown_Attribute       0x0030   100   100   000    Old_age   Offline      -       2
186 Unknown_Attribute       0x0032   253   253   000    Old_age   Always       -       1441792
187 Reported_Uncorrect      0x0032   100   026   000    Old_age   Always       -       281470684365183
188 Command_Timeout         0x0032   100   099   000    Old_age   Always       -       1
189 High_Fly_Writes         0x003a   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   059   050   045    Old_age   Always       -       41 (Min/Max 37/42)
191 G-Sense_Error_Rate      0x0032   253   098   000    Old_age   Always       -       16580617
192 Power-Off_Retract_Count 0x0032   096   096   000    Old_age   Always       -       71566404
193 Load_Cycle_Count        0x0032   099   099   000    Old_age   Always       -       35590
195 Hardware_ECC_Recovered  0x003a   253   253   000    Old_age   Always       -       68959
196 Reallocated_Event_Count 0x0032   253   253   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   100   087   000    Old_age   Always       -       1
198 Offline_Uncorrectable   0x0030   253   253   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   253   253   000    Old_age   Always       -       0

SMART Error Log Version: 1
ATA Error Count: 519 (device log contains only the most recent five errors)
    CR = Command Register [HEX]
    FR = Features Register [HEX]
    SC = Sector Count Register [HEX]
    SN = Sector Number Register [HEX]
    CL = Cylinder Low Register [HEX]
    CH = Cylinder High Register [HEX]
    DH = Device/Head Register [HEX]
    DC = Device Command Register [HEX]
    ER = Error register [HEX]
    ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 519 occurred at disk power-on lifetime: 5685 hours (236 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 03 10 00 00 00  Error: 

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  00 00 01 01 00 00 00 ff      00:01:40.036  NOP [Abort queued commands]
  00 00 01 01 00 00 00 ff      00:01:30.023  NOP [Abort queued commands]
  00 00 01 01 00 00 00 ff      00:01:20.011  NOP [Abort queued commands]
  2f 00 01 10 00 00 a0 08      00:01:15.009  READ LOG EXT
  60 08 38 f0 68 47 40 08      00:01:08.725  READ FPDMA QUEUED

Error 518 occurred at disk power-on lifetime: 5685 hours (236 days + 21 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 41 03 d8 5b e2 40  Error: UNC at LBA = 0x00e25bd8 = 14834648

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 08 38 f0 68 47 40 08      00:01:08.725  READ FPDMA QUEUED
  60 08 30 40 09 84 40 08      00:01:08.568  READ FPDMA QUEUED
  61 08 28 70 09 9d 40 08      00:01:08.243  WRITE FPDMA QUEUED
  61 a0 20 00 55 d6 40 08      00:01:07.961  WRITE FPDMA QUEUED
  61 08 18 68 09 9d 40 08      00:01:07.594  WRITE FPDMA QUEUED

Error 517 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 00 00 00 a0

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ec 00 00 00 00 00 a0 08      00:03:39.320  IDENTIFY DEVICE
  c8 00 80 80 28 97 ec 08      00:03:30.939  READ DMA
  c8 00 80 20 2a 97 ec 08      00:03:27.409  READ DMA
  c8 00 90 c0 5b e2 e5 08      00:03:27.394  READ DMA
  ca 00 98 00 9b 98 ec 08      00:03:27.393  WRITE DMA

Error 516 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 00 00 00 a0

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ec 00 00 00 00 00 a0 08      00:03:23.216  IDENTIFY DEVICE
  c8 00 40 40 28 97 ec 08      00:03:14.822  READ DMA
  ef 10 02 00 00 00 a0 08      00:03:14.821  SET FEATURES [Reserved for Serial ATA]
  ec 00 00 00 00 00 a0 08      00:03:14.819  IDENTIFY DEVICE
  ef 03 45 00 00 00 a0 08      00:03:14.819  SET FEATURES [Set transfer mode]

Error 515 occurred at disk power-on lifetime: 5654 hours (235 days + 14 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 00 00 00 00 a0

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  ec 00 00 00 00 00 a0 08      00:03:14.815  IDENTIFY DEVICE
  c8 00 40 40 28 97 ec 08      00:03:06.445  READ DMA
  c8 00 08 18 2a 97 ec 08      00:03:04.772  READ DMA
  ef 10 02 00 00 00 a0 08      00:03:04.772  SET FEATURES [Reserved for Serial ATA]
  ec 00 00 00 00 00 a0 08      00:03:04.770  IDENTIFY DEVICE

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Extended offline    Completed: read failure       60%      5692         201724258
# 2  Extended offline    Aborted by host               90%      5691         -
# 3  Short offline       Completed without error       00%      5690         -
# 4  Extended offline    Completed: read failure       60%      5618         201724230
# 5  Short offline       Completed without error       00%      5617         -
# 6  Short offline       Completed without error       00%      5617         -
# 7  Extended offline    Completed without error       00%      5600         -
# 8  Short offline       Completed: read failure       90%      5595         239457889
# 9  Short offline       Completed: read failure       90%      5595         239457889
#10  Short captive       Completed without error       00%      5305         -
#11  Short captive       Completed without error       00%      5301         -
#12  Short captive       Completed without error       00%      5301         -
#13  Short captive       Completed without error       00%      5301         -
#14  Short captive       Completed: read failure       90%      5301         214242167
#15  Extended offline    Completed: read failure       60%      4819         176075039
#16  Short offline       Completed without error       00%      4819         -
#17  Short offline       Aborted by host               90%       214         -
#18  Short offline       Aborted by host               90%       214         -
#19  Short offline       Completed without error       00%       214         -
#20  Short offline       Completed without error       00%       214         -
#21  Short offline       Completed without error       00%         4         -
4 of 6 failed self-tests are outdated by newer successful extended offline self-test # 7

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Atualizar Corri os badblocks usando sudo badblocks -v / dev / sda > bad-blocks-result Resultado: Passe concluído, 25 blocos defeituosos encontrados. (25/0/0 erros) O que eu faço agora?

O arquivo de saída indica os seguintes números de bloco: 105877868 105877869 105877870 105877871 105877872 105877873 105877880 105877881 105877882 105877883 105877892 105877893 105877894 105877900 105877901 105877902 105877903 105877908 105877909 105877910 105877911 105877916 105877917 105877918 105877919

    
por user251067 22.02.2014 / 12:52

3 respostas

6

Faça o download de gsmartcontrol digitando sudo apt-get install gsmartcontrol

Usando gsmartcontrol :

  • executar um short self-test ;
  • se for concluído sem erro, execute um extended self-test .

Se este também estiver bom, então provavelmente não há motivo para pânico. Se, no entanto, os testes detectarem alguns bad blocks , você possivelmente precisará fazer um backup usando ddrescue ASAP e, em seguida, tentar entender o que está errado com seu disco rígido. Pode estar falhando, ou pode haver apenas um punhado de setores ruins irrelevantes.

Veja também:

UPDATE:
Dado que apenas um punhado de setores defeituosos parecem estar presentes, você poderia tentar dizer ao FS quais devem evitar usando fsck.ext3 -c . Mas leia man fsck.ext3 (assumindo que este é seu FS) antes de usá-lo.

Veja:

por landroni 22.02.2014 / 21:55
4

Parece que seu disco está com problemas, eu faço backup dos dados o mais rápido possível e substituo o disco com falha.

    
por user251046 22.02.2014 / 12:56
1

Eu tive um problema semelhante recentemente e o smart relatou 9 bloqueios ruins. Eu iniciei a partir de mídia ao vivo e, em seguida, eu consertei o sistema de arquivos ext4 com e2fsck -c /dev/SDx onde SDx era a unidade em questão (sda no meu caso). o que resultou em várias leituras curtas que eu ignorei e forcei a reescrever e encontrei e consertei 5 inodes com blocos reivindicados por multiplicação.

Se a unidade contiver dados críticos , você deve, naturalmente, utilize a estratégia correta para fazer backup dos dados antes de fazer qualquer outra coisa . Se não como no meu caso, continue a ler. dmesg relatou quase o dobro de setores defeituosos que foram encontrados pela SMART, então eu executei e2fsck -cc /dev/SDx onde SDx era a unidade em questão para executar um teste de leitura / gravação não destrutivo. Este foi um processo claramente demorado, no entanto, como meu objetivo era apenas espremer mais algumas horas do que é, para todos os efeitos, uma "unidade de raspadinha" usada para experimentação sem dados críticos, enquanto eu esperava pela substituição. dirigir para ser entregue, eu senti que poderia valer a pena o tempo. Uma hora depois, com 15% de conclusão em um terabyte, eu não estava tão certo, mas como a substituição estava a três dias de distância, eu perseverei. No final, todos os setores defeituosos foram adicionados à lista de inode do bad block, o que impede que eles sejam alocados em um arquivo ou diretório.

    
por Elder Geek 10.01.2018 / 00:09

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