Um artigo sobre este assunto foi publicado aqui .
"The goal of this paper is to answer questions such as the following: How common are memory errors in practice? What are their statistical properties? How are they affected by external factors, such as temperature and utilization, and by chip-specific factors, such as chip density, memory technology and DIMM age?"
E isso faz parte dos resumos:
"This either indicates that chip size does not play a dominant role in influencing CEs or >there are other, stronger confounders in our data that we did not control for." >Similarly, "In all cases, for the same utilization levels the error rates for high versus >low temperature are very similar."
Eu ainda recomendaria o ECC para sistemas de produção, lembre-se.