Comprei um novo laptop HP Omen 15-ce084no selado em fábrica que veio com o Windows 10 Tem um disco mecânico de 256GB SSD e 1TB. Depois de verificar que tudo funcionava no Windows, eu me livrei dele e instalei o Ubuntu 16.04.3 LTS com o kernel Linux 4.10 no SSD e configurei o disco mecânico como um armazenamento de dados. Fiquei feliz (e surpreso) que absolutamente tudo, incluindo Wi-Fi, placa de vídeo e controles de teclado retroiluminado, funcionou fora do padrão no Ubuntu. Depois de instalar os drivers proprietários, meu laptop estava pronto para uso sério.
No entanto, durante a configuração das minhas coisas, notei que o disco de 1 TB faz um som de clique suave a cada segundo durante a execução do Ubuntu. Ele não fez isso no Windows 10, tenho certeza disso, e não faz isso enquanto acessa as configurações da BIOS, por exemplo. Ele começa a clicar cerca de 30 segundos após o Ubuntu ter iniciado e você não precisa estar logado como usuário. Ele também clica enquanto está na tela de login do lightdm
ou enquanto Ctrl + Alt + F1 em um terminal.
Eu pesquisei algumas vezes e descobri muitos casos de cliques semelhantes no Linux, cujas soluções giravam em torno do estacionamento principal & problemas de economia de energia, como ajustes de hdparm nas configurações. Nenhum deles funcionou no meu laptop e o clique continua. Eu corro smartctl -a no disco e notei valores anormais para um disco supostamente novo (Power-Off_Retract_Count = 524296). Além disso, o som do clique, apesar de suave, é muito chato e não aguento mais, mesmo que não seja perigoso para o disco.
Alguém pode ver os relatórios abaixo e responder a estas perguntas:
- Como esses valores são possíveis em um novo disco rígido?
- O disco rígido está com defeito e devo substituí-lo?
- O Ubuntu / Linux causou isso e destruiu o disco rígido tão rapidamente (em cerca de 31 horas de tempo de execução)?
-
Se a causa for o Ubuntu / Linux, existe uma solução software para o problema que não seja proposto nesses links, nenhum de qual trabalho:
Aqui está a saída do smartctl -a com algumas partes do ID removidas:
smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.10.0-40-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: HGST Travelstar 7K1000
Device Model: HGST HTS721010A9E630
Serial Number: JR10XXXXXXXXXX
LU WWN Device Id: 5 000cca XXXXXXXXX
Firmware Version: JB0OA3T0
User Capacity: 1,000,204,886,016 bytes [1.00 TB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: 7200 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 3.0, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Thu Nov 30 20:03:48 2017 EET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 45) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 160) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 100 100 062 Pre-fail Always - 0
2 Throughput_Performance 0x0025 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0023 121 100 033 Pre-fail Always - 2
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 32
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x002f 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 31
10 Spin_Retry_Count 0x0033 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 31
183 Runtime_Bad_Block 0x0032 100 100 000 Old_age Always - 0
184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
188 Command_Timeout 0x0032 100 100 000 Old_age Always - 0
190 Airflow_Temperature_Cel 0x0022 076 053 045 Old_age Always - 24 (Min/Max 24/24)
191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 8
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 524296
193 Load_Cycle_Count 0x0032 100 100 000 Old_age Always - 237
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0036 100 100 000 Old_age Always - 0
223 Load_Retry_Count 0x002a 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours)
LBA_of_first_error
# 1 Short offline Completed without error 00% 3 -
# 2 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
Agora, compare essa saída com meu disco de 5 anos ou mais de um laptop antigo, que está executando o Ubuntu 16.04 LTS há cerca de 1,5 anos e o Windows 7 antes disso:
smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-101-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Travelstar 5K500.B
Device Model: Hitachi HTS545025B9A300
Serial Number: 1007XXXXXXXXXXXXXXXX
LU WWN Device Id: 5 000cca XXXXXXXXX
Firmware Version: PB2OC64G
User Capacity: 250,059,350,016 bytes [250 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: 5400 rpm
Form Factor: 2.5 inches
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA8-ACS T13/1699-D revision 6
SATA Version is: SATA 2.6, 3.0 Gb/s
Local Time is: Thu Nov 30 19:58:27 2017 EET
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine
completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 645) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 83) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED
WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 201 201 033 Pre-fail Always - 1
4 Start_Stop_Count 0x0012 096 096 000 Old_age Always - 7777
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 048 048 000 Old_age Always - 23080
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 096 096 000 Old_age Always - 7763
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 136
193 Load_Cycle_Count 0x0012 083 083 000 Old_age Always - 171510
194 Temperature_Celsius 0x0002 144 144 000 Old_age Always - 38 (Min/Max 16/50)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
ATA Error Count: 2
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 2 occurred at disk power-on lifetime: 14089 hours (587 days + 1 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 52 f9 d9 f8 e0 Error: UNC 82 sectors at LBA = 0x00f8d9f9 = 16308729
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7f cc d9 f8 e0 00 00:00:18.800 READ DMA EXT
25 00 7f 4d d9 f8 e0 00 00:00:18.800 READ DMA EXT
25 00 7f ce d8 f8 e0 00 00:00:18.800 READ DMA EXT
25 00 7f 4f d8 f8 e0 00 00:00:18.800 READ DMA EXT
25 00 7f d0 d7 f8 e0 00 00:00:18.800 READ DMA EXT
Error 1 occurred at disk power-on lifetime: 14089 hours (587 days + 1 hours)
When the command that caused the error occurred, the device was active or
idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 52 f9 d9 f8 e0 Error: UNC 82 sectors at LBA = 0x00f8d9f9 = 16308729
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 7f cc d9 f8 e0 00 00:00:39.800 READ DMA EXT
25 00 7f 4d d9 f8 e0 00 00:00:39.800 READ DMA EXT
25 00 7f ce d8 f8 e0 00 00:00:39.800 READ DMA EXT
25 00 7f 4f d8 f8 e0 00 00:00:39.800 READ DMA EXT
25 00 7f d0 d7 f8 e0 00 00:00:39.800 READ DMA EXT
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.